H<sub>2</sub>S dosimeter with controllable percolation threshold based on semi-conducting copper oxide thin films

Seitz, Christoph; Beck, Giuliana; Hennemann, Jörg; Kandzia, Christian; Hering, Karl P.; Polity, Angelika; Klar, Peter J.; Paul, Andrej; Wagner, Thorsten; Russ, Stefanie; Smarsly, Bernd M.

doi:https://doi.org/10.5194/jsss-6-163-2017

Articles | Volume 6, issue 1

https://doi.org/10.5194/jsss-6-163-2017

© Author(s) 2017. This work is distributed under
the Creative Commons Attribution 3.0 License.

Special issue:

Sensors and Measurement Systems 2016

https://doi.org/10.5194/jsss-6-163-2017

© Author(s) 2017. This work is distributed under
the Creative Commons Attribution 3.0 License.

Articles | Volume 6, issue 1

Regular research article

|

02 May 2017

Regular research article |

| 02 May 2017

H₂S dosimeter with controllable percolation threshold based on semi-conducting copper oxide thin films

Christoph Seitz, Giuliana Beck, Jörg Hennemann, Christian Kandzia, Karl P. Hering, Angelika Polity, Peter J. Klar, Andrej Paul, Thorsten Wagner, Stefanie Russ, and Bernd M. Smarsly

Data sets

Data of ``H2S dosimeter with controllable percolation threshold based on semi-conducting copper oxide thin films'' published in JSSS 2017 C. Seitz, G. Beck, J. Hennemann, C. Kandzia, K. P. Hering, A. Polity, P. J. Klar, A. Paul, T. Wagner, S. Russ, S., and B. M. Smarsly https://doi.org/10.5281/zenodo.569253